ANALYTICAL AND NUMERICAL COMPUTATION OF ELECTRICAL RESISTANCE IN A LOW CURRENT MULTI-SPOTS METALLIC CONTACT
DOI:
https://doi.org/10.36801/Keywords:
ANALYTICAL AND NUMERICAL COMPUTATION, ELECTRICAL RESISTANCE, LOW CURRENT, MULTI-SPOTS METALLIC CONTACTAbstract
The problem concerning the specific resistance of electrical contacts is still of special importance especially in high complexity electrical systems or critical operation devices such as those used in the automotive industry. A huge number of studies have been conducted over time in order to develop easy models that allow the calculation of the contact resistance at the interface between two conductors taking into account the discontinuity of the contact surface. This paper presents a study on the computation of the contact resistance of two metal conductors with analytical relations and, respectively, using numerical computation models. The aim of this paper is to examine the differences between the results obtained using analytical models and numerical models based on the finite element method (FEM) in COMSOL Multiphysics.
References
(1) J. Lim, H. Kim, J. K. Kim, S. J. Park, T. H. Lee, S. W. Yoon, "Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles," in IEEE Access, vol. 7, pp. 126530-126538, 2019.
(2) Min LIU, A New Method for Measuring Contact Resistance‖ Beijing Orient Institute of Measurement & Test Chinese Academy of Space Technology.
(3) https://www.testequipmentdepot.com/megger/pdf/low-resistance-testing.pdf
(4) G. G. Dankat, A. A. Dobre, L. M. Dumitran, "Influence of Ageing on Electrothermal Condition of Low Current Contact," 2021 12th International Symposium on Advanced Topics in Electrical Engineering (ATEE), 2021, pp. 1-6.
(5) J. Swingler, J.W. McBride, C. Maul, The degradation of road-tested automotive connectors‖, IEEE Trans. Comp. Packag. Technol 23 (1), pp. 157–164, 2000.
(6) Wang Shujuan, Hu Fang, Su Bonan, Zhai Guofu, "Method for calculation of contact resistance and finite element simulation of contact temperature rise based on rough surface contact model," 26th International Conference on Electrical Contacts (ICEC 2012), Beijing, pp. 317-321, 2012.
(7) R.Holm, Electric Contacts, Theory and Application, Berlin: Springer-Verlag, 1967 4th Edition.
(8) M. Nakamura, I. Minowa, Computer simulation for the conductance of a contact interface, IEEE Trans. Comp., Hybrids, Manufact.Technol., vol. CHMT-9, pp. 150–155, June 1986.
(9) M. Nakamura, I. Minowa, Film resistance and constriction effect of current in a contact interface, IEEE Trans. Comp., Hybrids, Manufact. Technol., vol.CHMT-12, pp. 109–113, Mar. 1989.
(10) M. Nakamura, Constriction resistance of conducting spots by the boundary element method, IEEE Trans. Comp., Hybrids, Manufact.Technol., vol. CHMT-16, pp. 339–343, May 1993.
(11) M. Nakamura, Computer simulation for the constriction resistance depending on the form of conducting spots, IEEE Trans. Comp., Packag., Manuf. Technol., A, vol. 18, pp. 382–383, June 1995.
(12) J. A. Greenwood, Constriction resistance and the real area of contact,‖Brit. J. Appl. Phys., vol. 17, pp. 1621–1632, 1966.
(13) L. Boyer, "Contact resistance calculations: generalizations of Greenwood's formula including interface films," in IEEE Transactions on Components and Packaging Technologies, vol. 24, no. 1, pp. 50-58, March 2001.
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