BUFIT: FINE-GRAINED DYNAMIC BURST FAULT INJECTION TOOL FOR EMBEDDED field programmable gate array TESTING. REVUE ROUMAINE DES SCIENCES TECHNIQUES — SÉRIE ÉLECTROTECHNIQUE ET ÉNERGÉTIQUE, [S. l.], v. 69, n. 3, p. 299–304, 2024. DOI: 10.59277/RRST-EE.2024.69.3.8. Disponível em: https://journal.iem.pub.ro/rrst-ee/article/view/519.. Acesso em: 4 dec. 2024.